Effect of Oxygen Treatment on the Electrical Performance and Reliability of IWO Thin-Film Transistors

Yi Xuan Chen, Yi Lin Wang, Fu Jyuan Li, Shu-Jui Chang, Tsung En Lee, Chao Ching Cheng, Meng Chien Lee, Hui Hsuan Li, Yu Hsien Lin*, Chao Hsin Chien*

*此作品的通信作者

研究成果: Article › 同行評審

1 引文 斯高帕斯（Scopus）

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Keyphrases

Material Science

Engineering

Chemical Engineering