Effect of nickel concentration on bias reliability and thermal stability of thin-film transistors fabricated by Ni-metal-induced crystallization

Engineering & Materials Science

• Thin film transistors 100%
• Crystallization 85%
• Thermodynamic stability 80%
• Nickel 72%
• Hot carriers 52%
• Metals 50%
• Contamination 37%
• Transistors 33%
• Organic light emitting diodes (OLED) 25%
• Temperature 23%
• Polysilicon 22%
• Leakage currents 21%
• Display devices 14%

Physics & Astronomy

• thermal stability 68%
• nickel 63%
• transistors 62%
• crystallization 60%
• thin films 40%
• metals 40%
• contamination 35%
• high temperature environments 27%
• silicon transistors 27%
• immunity 22%
• leakage 16%
• light emitting diodes 15%
• traps 14%
• performance 8%
• temperature 5%