Effect of Local Substrate Removal and Backside Al Heat Dissipation Layer on GaN-on-Si Device RF Performance

Yuan Lin*, Hsuan Yao Huang, You Chen Weng, Hao Chung Kuo, Chang Fu Dee, Chun Hsiung Lin, Edward Yi Chang

*此作品的通信作者

研究成果: Article › 同行評審

指紋

深入研究「Effect of Local Substrate Removal and Backside Al Heat Dissipation Layer on GaN-on-Si Device RF Performance」主題。共同形成了獨特的指紋。

Keyphrases

Engineering