Effect of electron-phonon scattering on shot noise in nanoscale junctions

Yu-Chang Chen*, Massimiliano Di Ventra

*此作品的通信作者

研究成果: Article同行評審

52 引文 斯高帕斯(Scopus)

摘要

We investigate the effect of electron-phonon inelastic scattering on shot noise in nanoscale junctions in the regime of quasiballistic transport. We predict that when the local thermal energy of the junction is larger than its lowest vibrational mode energy eVc, the inelastic contribution to shot noise (conductance) increases (decreases) with bias as V (V). The corresponding Fano factor thus increases as V. We also show that the inelastic contribution to the Fano factor saturates with increasing thermal current exchanged between the junction and the bulk electrodes to a value which, for VVc, is independent of bias. These predictions can be readily tested experimentally.

原文English
文章編號166802
期刊Physical Review Letters
95
發行號16
DOIs
出版狀態Published - 12 10月 2005

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