Effect of (111) Surface Ratio on the Bonding Quality of Cu-Cu Joints

Jian Yuan Huang*, Chih Chen

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

In this study, we deposited nano-twinned Cu with various (111) ratios onto Si substrates by adjusting the electroplating parameters. Cu films with 38.7, 75.5, 94.1% of (111) surface ratio were electrodeposited. The grain sizes and surface roughness for the different specimens were controlled. To investigate the effect of the (111) ratio on Cu-to-Cu bonding, the samples were bonded at a temperature of 200 °C using a thermal compression bonding machine. The results indicate the surface (111) ratio affects the bonding strength significantly. The shear strength was 10.22 MPa, 19.08 MPa, and 23.63 MPa for the specimen with 38.7%, 75.5%, and 94.1% (111) surface ratio, respectively. Additionally, continuous voids were observed in the bonded specimen with a low (111)-oriented ratio of 38.7%. The continuous voids can be eliminated by increasing the (111)-oriented surface ratio. This research provides crucial fundamental knowledge for the effect of (111) surface percentage on the Cu-Cu bonding for 3D IC technology.

原文English
主出版物標題Proceedings - IEEE 74th Electronic Components and Technology Conference, ECTC 2024
發行者Institute of Electrical and Electronics Engineers Inc.
頁面626-630
頁數5
ISBN(電子)9798350375985
DOIs
出版狀態Published - 2024
事件74th IEEE Electronic Components and Technology Conference, ECTC 2024 - Denver, 美國
持續時間: 28 5月 202431 5月 2024

出版系列

名字Proceedings - Electronic Components and Technology Conference
ISSN(列印)0569-5503

Conference

Conference74th IEEE Electronic Components and Technology Conference, ECTC 2024
國家/地區美國
城市Denver
期間28/05/2431/05/24

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