Editorial: Applied AI for Reliability and Cybersecurity

^*此作品的通信作者

研究成果: Editorial

原文	English
頁（從 - 到）	1996-1997
頁數	2
期刊	IEEE Transactions on Reliability
卷	74
發行號	1
DOIs	https://doi.org/10.1109/TR.2025.3541482
出版狀態	Published - 2025

存取文件

@article{43f2f0f1f90b469f80937f6b305604ea,

title = "Editorial: Applied AI for Reliability and Cybersecurity",

author = "Winston Shieh",

year = "2025",

doi = "10.1109/TR.2025.3541482",

language = "English",

volume = "74",

pages = "1996--1997",

journal = "IEEE Transactions on Reliability",

issn = "0018-9529",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1",

}

TY - JOUR

T1 - Editorial

T2 - Applied AI for Reliability and Cybersecurity

AU - Shieh, Winston

PY - 2025

Y1 - 2025

UR - https://www.scopus.com/pages/publications/105002798326

U2 - 10.1109/TR.2025.3541482

DO - 10.1109/TR.2025.3541482

M3 - Editorial

AN - SCOPUS:105002798326

SN - 0018-9529

VL - 74

SP - 1996

EP - 1997

JO - IEEE Transactions on Reliability

JF - IEEE Transactions on Reliability

IS - 1

ER -