Edge diffraction induced near-field contrast in subwavelength structures

Hsieh Li Chou, Yi-Chun Chen, Pei Kuen Wei

研究成果: Conference contribution同行評審

摘要

Optical near-field in subwavelength air-dielectric structure is studied by a collection-mode nearfield optical microscopy. Concentrated optical near-field and large polarization anisotropy at the dielectric regions are measured. From the simulation of finite-difference time-domain method, we conclude the edge diffraction dominating the optical near-field distribution.

原文English
主出版物標題CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics
主出版物子標題Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
頁面118
頁數1
ISBN(電子)0780377664
DOIs
出版狀態Published - 2003
事件5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003 - Taipei, 台灣
持續時間: 15 12月 200319 12月 2003

出版系列

名字Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
1

Conference

Conference5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003
國家/地區台灣
城市Taipei
期間15/12/0319/12/03

指紋

深入研究「Edge diffraction induced near-field contrast in subwavelength structures」主題。共同形成了獨特的指紋。

引用此