This paper describes the development of a novel, flexible, with appropriate accuracy dynamic characteristics measurement system for optical scanning micromirror. With the system, we can measure dynamic behaviors such as transient response, scan speed, scan angle, scan repeatability, and scan non-linearity of the scanning micromirror devices. Moreover, the optical system performances such as scan spot size and even scan spot intensity can also be obtained.
|頁（從 - 到）||180-186|
|期刊||Proceedings of SPIE - The International Society for Optical Engineering|
|出版狀態||Published - 27 11月 2000|
|事件||Micromachining and Microfabrication - Singapure, Singapore|
持續時間: 28 11月 2000 → 30 11月 2000