Double snapback characteristics in high-voltage nMOSFETs and the impact to on-chip ESD protection design

Ming-Dou Ker*, Kun Hsien Lin

*此作品的通信作者

    研究成果: Article同行評審

    38 引文 斯高帕斯(Scopus)

    指紋

    深入研究「Double snapback characteristics in high-voltage nMOSFETs and the impact to on-chip ESD protection design」主題。共同形成了獨特的指紋。

    Engineering

    Keyphrases

    Physics

    Earth and Planetary Sciences