DNA mismatch detection by metal ion enhanced impedance analysis

Peng Chung Jangjian, Tzeng-Feng Liu, Chuan Mei Tsai, Mei Yi Li, Ming Shih Tsai, Shin Hua Tseng, Tsai Mu Cheng, Chia-Ching Chang*


研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)


Conventional diagnoses of genetic mutation and disease depend on the analysis of DNA sequences. However, mismatches in the DNA sequences are difficult to detect using tradi- tional sequencing. Doping metal ions, such as nickel, into the short DNA (28 mer ~ 30 mer), markedly reduces its electrical resistance, which is measured by electrical impedance analysis. The change in resistance that is caused by a mismatched base-pair in short DNA can also be monitored by this approach. In this study, the resistance increased exponentially with the number of mismatched base-pairs. Accordingly, an intuitive and direct method for evaluating the number of DNA mismatches can possibly be developed.

頁(從 - 到)740-747
期刊Chinese Journal of Physics
出版狀態Published - 1 10月 2009


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