Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu*, Y. F. Liao, V. T. Tra, J. C. Yang, W. Z. Liu, Ying-hao Chu, Jiunn-Yuan Lin, J. H. Huang, J. Weinen, S. Agrestini, K. D. Tsuei, D. J. Huang

*此作品的通信作者

研究成果: Article同行評審

10 引文 斯高帕斯(Scopus)

摘要

We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

原文English
文章編號262101
頁數3
期刊Applied Physics Letters
99
發行號26
DOIs
出版狀態Published - 26 12月 2011

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