Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu; Y. F. Liao; V. T. Tra; J. C. Yang; W. Z. Liu; Ying-hao Chu; Jiunn-Yuan Lin; J. H. Huang; J. Weinen; S. Agrestini; K. D. Tsuei; D. J. Huang

doi:10.1063/1.3672099

Distribution of electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu^*, Y. F. Liao, V. T. Tra, J. C. Yang, W. Z. Liu, Ying-hao Chu, Jiunn-Yuan Lin, J. H. Huang, J. Weinen, S. Agrestini, K. D. Tsuei, D. J. Huang

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10 引文斯高帕斯（Scopus）

摘要

We investigated the electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti ⁴⁺ to Ti ³⁺ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO ₃ with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

原文	English
文章編號	262101
頁數	3
期刊	Applied Physics Letters
卷	99
發行號	26
DOIs	https://doi.org/10.1063/1.3672099
出版狀態	Published - 26 12月 2011

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title = "Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy",

abstract = "We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48{\AA} (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.",

author = "Chu, {Y. Y.} and Liao, {Y. F.} and Tra, {V. T.} and Yang, {J. C.} and Liu, {W. Z.} and Ying-hao Chu and Jiunn-Yuan Lin and Huang, {J. H.} and J. Weinen and S. Agrestini and Tsuei, {K. D.} and Huang, {D. J.}",

year = "2011",

month = dec,

day = "26",

doi = "10.1063/1.3672099",

language = "English",

volume = "99",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

AU - Chu, Y. Y.

AU - Liao, Y. F.

AU - Tra, V. T.

AU - Yang, J. C.

AU - Liu, W. Z.

AU - Chu, Ying-hao

AU - Lin, Jiunn-Yuan

AU - Huang, J. H.

AU - Weinen, J.

AU - Agrestini, S.

AU - Tsuei, K. D.

AU - Huang, D. J.

PY - 2011/12/26

Y1 - 2011/12/26

N2 - We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

AB - We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

UR - http://www.scopus.com/inward/record.url?scp=84862961755&partnerID=8YFLogxK

U2 - 10.1063/1.3672099

DO - 10.1063/1.3672099

M3 - Article

AN - SCOPUS:84862961755

VL - 99

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 26

M1 - 262101

ER -

Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

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Distribution of electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface revealed by hard x-ray photoemission spectroscopy