Direct imprint in metal film stacks with low pressure and low temperature for optical elements applications

H. C. Cheng*, S. Y. Chuang, H. L. Chen, Y. L. Hung, Fu-Hsiang Ko

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

The improvements being done to the direct imprint process using a sharp mold and inserting a soft pad, which is the diluted resist between the gold film and the substrate were discussed. A silicon mold was fabricated using electron beam lithography followed by the anisotropic reactive ion etching (RIE) process. It was observed that the temperature of the direct imprint process must be maintained below the glass transition temperature of the bottom soft pad to avoid pattern distortion. To understand the influence of temperature in the direct imprint process, the film stacks were imprinted with different temperatures using a mold profile controlling.

原文English
主出版物標題Digest of Papers - Microprocesses and Nanotechnology 2004
頁面138-139
頁數2
DOIs
出版狀態Published - 1 12月 2004
事件2004 International Microprocesses and Nanotechnology Conference - Osaka, Japan
持續時間: 26 10月 200429 10月 2004

出版系列

名字Digest of Papers - Microprocesses and Nanotechnology 2004

Conference

Conference2004 International Microprocesses and Nanotechnology Conference
國家/地區Japan
城市Osaka
期間26/10/0429/10/04

指紋

深入研究「Direct imprint in metal film stacks with low pressure and low temperature for optical elements applications」主題。共同形成了獨特的指紋。

引用此