TY - JOUR
T1 - Digital readout optimization of the random resistive states in magnetic tunnel junction
AU - Egler, Thomas
AU - Dittmann, Hans
AU - Useinov, Artur
PY - 2020/1
Y1 - 2020/1
N2 - True random number generators (TRNGs) provide a wide area of applications and can be fabricated on the basis of magnetic tunnel junctions (MTJs). This work represents the modeling of TRNG readout optimization, where the induced digital random bit is detected within only a single computational period. The period contains two sub-cycles: write and joined read & reset cycles. The system has a valuable potential to become stochastically independent after calibrating at the desired working point against the factors, which cause to the signal deviations: temperature-induced, material degradation or other problems.
AB - True random number generators (TRNGs) provide a wide area of applications and can be fabricated on the basis of magnetic tunnel junctions (MTJs). This work represents the modeling of TRNG readout optimization, where the induced digital random bit is detected within only a single computational period. The period contains two sub-cycles: write and joined read & reset cycles. The system has a valuable potential to become stochastically independent after calibrating at the desired working point against the factors, which cause to the signal deviations: temperature-induced, material degradation or other problems.
KW - Magnetic tunnel junctions
KW - Stochastic switching
KW - True random number generators
UR - http://www.scopus.com/inward/record.url?scp=85072707265&partnerID=8YFLogxK
U2 - 10.1016/j.sse.2019.107666
DO - 10.1016/j.sse.2019.107666
M3 - Article
AN - SCOPUS:85072707265
SN - 0038-1101
VL - 163
SP - 1
EP - 4
JO - Solid-State Electronics
JF - Solid-State Electronics
M1 - 107666
ER -