Digital Gate Driving (DGD) is Double-Edged Sword: How to Avoid Huge Voltage Overshoots Caused by DGD for GaN FETs
Ryunosuke Katada, Katsuhiro Hata, Yoshitaka Yamauchi, Ting Wei Wang, Ryuzo Morikawa, Cheng Hsuan Wu, Toru Sai, Po Hung Chen, Makoto Takamiya
研究成果: Conference contribution › 同行評審
3
引文
斯高帕斯（Scopus）