Device breakdown optimization of Al2O3/GaN MISFETs

X. Kang, D. Wellekens, M. Van Hove, B. De Jaeger, N. Ronchi, Tian-Li Wu, S. You, B. Bakeroot, J. Hu, D. Marcon, S. Stoffels, S. Decoutere

研究成果: Conference contribution同行評審

5 引文 斯高帕斯(Scopus)

摘要

In this paper we demonstrate a solution to achieve robust enhancement-mode Al2O3/GaN MISFETs with a high breakdown voltage and suggest a possible model for the device off-state breakdown. It is found that the device breakdown exhibits different gate voltage dependence for different surface treatments before the gate dielectric deposition. The device performance is greatly improved by using an in-situ surface plasma treatment. The improved device performance is explained by a reduction of traps at the Al2O3/GaN interface, which finally leads to a reduction in the amount of trapped positive charges and associated with that a reduction of the effective electric field across the gate dielectric when the device is in off-state. Several experimental results support this hypothesis: (1) The recoverable negative threshold voltage shift after reverse gate bias depends on the interface clean before gate dielectric deposition, (2) The reverse bias gate dielectric breakdown voltage is improved by this interface plasma treatment, although the forward bias gate dielectric breakdown voltage is identical.

原文English
主出版物標題2016 International Reliability Physics Symposium, IRPS 2016
發行者Institute of Electrical and Electronics Engineers Inc.
頁面CD51-CD54
ISBN(電子)9781467391368
DOIs
出版狀態Published - 22 9月 2016
事件2016 International Reliability Physics Symposium, IRPS 2016 - Pasadena, United States
持續時間: 17 4月 201621 4月 2016

出版系列

名字IEEE International Reliability Physics Symposium Proceedings
2016-September
ISSN(列印)1541-7026

Conference

Conference2016 International Reliability Physics Symposium, IRPS 2016
國家/地區United States
城市Pasadena
期間17/04/1621/04/16

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