Deterioration of near-UV GaN-based LEDs in seawater vapour

Yi Tai Chen, Bo Hong Lin, Ssu Han Lu, Zi Wei Li, Yu Sheng Tsai, Tai Ping Sun, Yew Chung Sermon Wu, Hsiang Chen*

*此作品的通信作者

研究成果: Article同行評審

4 引文 斯高帕斯(Scopus)

摘要

Reliability investigations were conducted after GaN-based LEDs were stressed in seawater vapour. Multiple electrical, optical, and material analyses on the fine nanostructures of the LED were examined. Results indicate that dark spots on the surface and etching trenches observed on the cross section might damage the quantum well and degrade LED performance. Dissolved sodium ions might diffuse and punch through the quantum well and be responsible for these spots and trenches.

原文English
文章編號103432
期刊Results in Physics
19
DOIs
出版狀態Published - 12月 2020

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