TY - GEN
T1 - Detecting stability faults in sub-threshold SRAMs
AU - Lin, Chen Wei
AU - Yang, Hao Yu
AU - Huang, Chin Yuan
AU - Chen, Hung Hsin
AU - Chao, Chia-Tso
PY - 2011/12/1
Y1 - 2011/12/1
N2 - Detecting stability faults has been a crucial task and a hot research topic for the testing of conventional super-threshold 6T SRAM in the past. When lowering the supply voltage of SRAM to the subthreshold region, the impact of stability faults may significantly change, and hence the test methods developed in the past for detecting stability faults may no longer be effective. In this paper, we first categorize the subthreshold-SRAM designs into different types according to their bit-cell structures. Based on each type, we then analyze the difference of its stability faults compared to the conventional super-threshold 6T SRAM, and discuss how the stability-fault test methods should be modified accordingly. A series of experiments are conducted to validate the effectiveness of each stability-fault test method for different types of subthreshold-SRAM designs.
AB - Detecting stability faults has been a crucial task and a hot research topic for the testing of conventional super-threshold 6T SRAM in the past. When lowering the supply voltage of SRAM to the subthreshold region, the impact of stability faults may significantly change, and hence the test methods developed in the past for detecting stability faults may no longer be effective. In this paper, we first categorize the subthreshold-SRAM designs into different types according to their bit-cell structures. Based on each type, we then analyze the difference of its stability faults compared to the conventional super-threshold 6T SRAM, and discuss how the stability-fault test methods should be modified accordingly. A series of experiments are conducted to validate the effectiveness of each stability-fault test method for different types of subthreshold-SRAM designs.
UR - http://www.scopus.com/inward/record.url?scp=84862970895&partnerID=8YFLogxK
U2 - 10.1109/ICCAD.2011.6105301
DO - 10.1109/ICCAD.2011.6105301
M3 - Conference contribution
AN - SCOPUS:84862970895
SN - 9781457713989
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 28
EP - 33
BT - 2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011
T2 - 2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011
Y2 - 7 November 2011 through 10 November 2011
ER -