Detecting solid-state disk geometry for write pattern optimization

Chun Chieh Kuo*, Jen Wei Hsieh, Li-Pin Chang

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

Solid-state disks use flash memory as their storage medium, and adopt a firmware layer that makes data mapping and wear leveling transparent to the hosts. Even though solid-state disks emulate a collection of logical sectors, the I/O delays of accessing all these logical sectors are not uniform because the management of flash memory is subject to many physical constraints of flash memory. This work proposes a collection of black-box tests can detect the geometry inside of a solid-state disk. The host system software can arrange data in the logical disk space according to the detected geometry information to match the host write pattern with the device characteristic for reducing the flash management overhead in solid-state disks.

原文English
主出版物標題Proceedings - 1st International Workshop on Cyber-Physical Systems, Networks, and Applications, CPSNA 2011, Workshop Held During RTCSA 2011
頁面89-94
頁數6
DOIs
出版狀態Published - 2011
事件1st International Workshop on Cyber-Physical Systems, Networks, and Applications, CPSNA 2011, Co-located with the 17th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications, RTCSA 2011 - Toyama, Japan
持續時間: 28 8月 201131 8月 2011

出版系列

名字Proceedings - 1st International Workshop on Cyber-Physical Systems, Networks, and Applications, CPSNA 2011, Workshop Held During RTCSA 2011
2

Conference

Conference1st International Workshop on Cyber-Physical Systems, Networks, and Applications, CPSNA 2011, Co-located with the 17th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications, RTCSA 2011
國家/地區Japan
城市Toyama
期間28/08/1131/08/11

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