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Design on mixed-voltage I/O buffers with slew-rate control in low-voltage CMOS process

  • Ming-Dou Ker*
  • , Tzu Ming Wang
  • , Fang Ling Hu
  • *此作品的通信作者

    研究成果: Conference contribution同行評審

    18 引文 斯高帕斯(Scopus)

    摘要

    A new design on mixed-voltage I/O buffers with slewrate control but without gate-oxide reliability problem in low-voltage CMOS process is proposed. The proposed circuit can effectively reduce the ground bounce effects without suffering gate-oxide reliability problems and hot-carrier degradation issues. The proposed mixed-voltage I/O buffer with slew-rate control has been designed in a 0.18-μm CMOS process to meet the 1.5-V/3.3-V applications.

    原文English
    主出版物標題Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008
    頁面1047-1050
    頁數4
    DOIs
    出版狀態Published - 26 12月 2008
    事件15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008 - St. Julian's, 馬耳他
    持續時間: 31 8月 20083 9月 2008

    出版系列

    名字Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008

    Conference

    Conference15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008
    國家/地區馬耳他
    城市St. Julian's
    期間31/08/083/09/08

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