Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

Shih Hung Chen; Ming-Dou Ker

doi:10.1109/VDAT.2009.5158161

Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

Shih Hung Chen^*, Ming-Dou Ker

^*此作品的通信作者

研究成果: Conference contribution › 同行評審

3 引文斯高帕斯（Scopus）

摘要

A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.

原文	English
主出版物標題	2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
頁面	327-330
頁數	4
DOIs	https://doi.org/10.1109/VDAT.2009.5158161
出版狀態	Published - 1 12月 2009
事件	2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 - Hsinchu, Taiwan 持續時間: 28 4月 2009 → 30 4月 2009

出版系列

名字	2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09

Conference

Conference	2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
國家/地區	Taiwan
城市	Hsinchu
期間	28/04/09 → 30/04/09

存取文件

10.1109/VDAT.2009.5158161

其它文件與鏈接

Link to publication in Scopus

引用此

Chen, S. H., & Ker, M-D. (2009). Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition. 於 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 (頁 327-330). Article 5158161 (2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09). https://doi.org/10.1109/VDAT.2009.5158161

@inproceedings{4336781a7b07415784bc27d5aa3a7ede,

title = "Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition",

abstract = "A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.",

author = "Chen, {Shih Hung} and Ming-Dou Ker",

year = "2009",

month = dec,

day = "1",

doi = "10.1109/VDAT.2009.5158161",

language = "English",

isbn = "9781424427826",

series = "2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09",

pages = "327--330",

booktitle = "2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09",

note = "2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 ; Conference date: 28-04-2009 Through 30-04-2009",

}

Chen, SH & Ker, M-D 2009, Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition. 於 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09., 5158161, 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09, 頁 327-330, 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09, Hsinchu, Taiwan, 28/04/09. https://doi.org/10.1109/VDAT.2009.5158161

Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition. / Chen, Shih Hung; Ker, Ming-Dou.
2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09. 2009. p. 327-330 5158161 (2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09).

研究成果: Conference contribution › 同行評審

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N2 - A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.

AB - A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.

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M3 - Conference contribution

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T3 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09

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T2 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09

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Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

摘要

出版系列

Conference

存取文件

其它文件與鏈接

指紋

引用此