@inproceedings{703decaf79674b519f12dd60c187820b,
title = "Design of high-voltage-tolerant power-rail ESD clamp circuit in low-voltage CMOS processes",
abstract = "A new high-voltage-tolerant power-rail electrostatic discharge (ESD) clamp circuit with a special ESD detection circuit realized with only 1×VDD devices for 3×VDD-tolerant mixed-voltage I/O interfaces is proposed. The proposed power-rail ESD clamp circuit with excellent ESD protection effectiveness has been verified in a 0.13-μm CMOS process with only 1.2-V devices.",
author = "Ming-Dou Ker and Wang, {Chang Tzu} and Tang, {Tien Hao} and Su, {Kuan Cheng}",
year = "2007",
month = sep,
day = "25",
doi = "10.1109/RELPHY.2007.369967",
language = "English",
isbn = "1424409195",
series = "Annual Proceedings - Reliability Physics (Symposium)",
pages = "594--595",
booktitle = "2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual",
note = "45th Annual IEEE International Reliability Physics Symposium 2007, IRPS ; Conference date: 15-04-2007 Through 19-04-2007",
}