TY - GEN
T1 - Design of 2xVDD-tolerant I/O buffer with 1xVDD CMOS devices
AU - Ker, Ming-Dou
AU - Lin, Yan Liang
PY - 2009/12/1
Y1 - 2009/12/1
N2 - A new 2xVDD-tolerant I/O buffer realized with only 1xVDD devices has been proposed and verified in a 0.18-μm CMOS process. With the dynamic source output technique and the new gate-controlled circuit, the new proposed I/O buffer can transmit and receive the signals with the voltage swing twice as high as the normal power supply voltage (VDD) without suffering gate-oxide reliability problem. The proposed 2xVDD-tolerant I/O circuit solution can be implemented in different nanoscale CMOS processes to meet the mixed-voltage interface applications in microelectronic systems.
AB - A new 2xVDD-tolerant I/O buffer realized with only 1xVDD devices has been proposed and verified in a 0.18-μm CMOS process. With the dynamic source output technique and the new gate-controlled circuit, the new proposed I/O buffer can transmit and receive the signals with the voltage swing twice as high as the normal power supply voltage (VDD) without suffering gate-oxide reliability problem. The proposed 2xVDD-tolerant I/O circuit solution can be implemented in different nanoscale CMOS processes to meet the mixed-voltage interface applications in microelectronic systems.
UR - http://www.scopus.com/inward/record.url?scp=74049164164&partnerID=8YFLogxK
U2 - 10.1109/CICC.2009.5280763
DO - 10.1109/CICC.2009.5280763
M3 - Conference contribution
AN - SCOPUS:74049164164
SN - 9781424440726
T3 - Proceedings of the Custom Integrated Circuits Conference
SP - 539
EP - 542
BT - 2009 IEEE Custom Integrated Circuits Conference, CICC '09
T2 - 2009 IEEE Custom Integrated Circuits Conference, CICC '09
Y2 - 13 September 2009 through 16 September 2009
ER -