TY - GEN
T1 - Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup
AU - Hsu, Sheng Fu
AU - Ker, Ming-Dou
PY - 2005/9
Y1 - 2005/9
N2 - The dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup (TLU) were characterized by device simulation and verified by experimental measurement. From the simulation results, the bi-polar trigger waveform with damping frequency of several tens of megahertz can trigger on TLU most easily. But, TLU is less sensitive to bi-polar trigger waveforms with an excessively large damping factor, an excessively high damping frequency, or an excessively low damping frequency. The simulation results have been experimentally verified with the silicon controlled rectifier (SCR) test structures fabricated in a 0.25-μm CMOS technology. Copyright 2005
AB - The dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup (TLU) were characterized by device simulation and verified by experimental measurement. From the simulation results, the bi-polar trigger waveform with damping frequency of several tens of megahertz can trigger on TLU most easily. But, TLU is less sensitive to bi-polar trigger waveforms with an excessively large damping factor, an excessively high damping frequency, or an excessively low damping frequency. The simulation results have been experimentally verified with the silicon controlled rectifier (SCR) test structures fabricated in a 0.25-μm CMOS technology. Copyright 2005
UR - http://www.scopus.com/inward/record.url?scp=70449706114&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:70449706114
SN - 158537069X
SN - 9781585370696
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005
T2 - 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005
Y2 - 8 September 2005 through 16 September 2005
ER -