TY - JOUR
T1 - DeepGD3
T2 - 39th Conference on Uncertainty in Artificial Intelligence, UAI 2023
AU - Ma, Ching Wen
AU - Liu, Yanwei
N1 - Publisher Copyright:
© UAI 2023. All rights reserved.
PY - 2023
Y1 - 2023
N2 - We present a novel approach for detecting soldering defects in Printed Circuit Boards (PCBs) composed mainly of Surface Mount Technology (SMT) components, using advanced computer vision and deep learning techniques. The main challenge addressed is the detection of soldering defects in new components for which only samples of good soldering are available at the model training phase. To address this, we design a system composed of generative and discriminative models to leverage the knowledge gained from the soldering samples of old components to detect the soldering defects of new components. To meet industrial quality standards, we keep the leakage rate (i.e., miss detection rate) low by making the system "unknown-aware" with a low unknown rate. We evaluated the method on a real-world dataset from an electronics company. It significantly reduces the leakage rate from 1.827% ± 3.063% and 1.942% ± 1.337% to 0.063% ± 0.075% with an unknown rate of 3.706% ± 2.270% compared to the discriminative and generative approaches, respectively.
AB - We present a novel approach for detecting soldering defects in Printed Circuit Boards (PCBs) composed mainly of Surface Mount Technology (SMT) components, using advanced computer vision and deep learning techniques. The main challenge addressed is the detection of soldering defects in new components for which only samples of good soldering are available at the model training phase. To address this, we design a system composed of generative and discriminative models to leverage the knowledge gained from the soldering samples of old components to detect the soldering defects of new components. To meet industrial quality standards, we keep the leakage rate (i.e., miss detection rate) low by making the system "unknown-aware" with a low unknown rate. We evaluated the method on a real-world dataset from an electronics company. It significantly reduces the leakage rate from 1.827% ± 3.063% and 1.942% ± 1.337% to 0.063% ± 0.075% with an unknown rate of 3.706% ± 2.270% compared to the discriminative and generative approaches, respectively.
UR - http://www.scopus.com/inward/record.url?scp=85170103403&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:85170103403
SN - 2640-3498
VL - 216
SP - 1326
EP - 1335
JO - Proceedings of Machine Learning Research
JF - Proceedings of Machine Learning Research
Y2 - 31 July 2023 through 4 August 2023
ER -