Deep Learning Approach to Modeling and Exploring Random Sources of Gate-All-Around Silicon Nanosheet MOSFETs

Rajat Butola, Yiming Li*, Sekhar Reddy Kola

*此作品的通信作者

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

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Chemical Compounds

Engineering & Materials Science