Deep Learning Approach to Estimating Work Function Fluctuation of Gate-All-Around Silicon Nanosheet MOSFETs with A Ferroelectric HZO Layer

Rajat Butola, Yiming Li*, Sekhar Reddy Kola

*此作品的通信作者

研究成果: Conference contribution › 同行評審

2 引文 斯高帕斯（Scopus）

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Engineering & Materials Science

Chemical Compounds