DC/AC/RF Characteristic Fluctuations Induced by Various Random Discrete Dopants of Gate-All-Around Silicon Nanowire n-MOSFETs

Wen Li Sung, Yi-Ming Li*

*此作品的通信作者

研究成果: Article › 同行評審

25 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering