@inproceedings{9cf08c45b7994480b07b914cb97bb880,
title = "Data analysis & prediction for NAND flash decoding status",
abstract = "This paper investigates the feasibility of predicting the NAND flash decoding status by machine learning algorithms. The memory system can handle the future decoding failure in advance according to the prediction results so that to relieve the penalties. Several data preprocessing techniques to improve the accuracy are addressed. A thorough analysis flow is given and the experimental results show significant improvements. Incorporating with proper memory error handling schemes, a 34% improvement in throughput can be achieved.",
author = "Liao, {Yen Chin} and Huang, {Ching Hui} and Cloud Zeng and Hsie-Chia Chang",
year = "2017",
month = jun,
day = "5",
doi = "10.1109/IMW.2017.7939076",
language = "English",
series = "2017 IEEE 9th International Memory Workshop, IMW 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2017 IEEE 9th International Memory Workshop, IMW 2017",
address = "United States",
note = "9th IEEE International Memory Workshop, IMW 2017 ; Conference date: 14-05-2017 Through 17-05-2017",
}