Current properties of GaN V-defect using conductive atomic force microscopy

Ling Lee*, Ching Shun Ku, Wen Cheng Ke, Chih Wei Ho, Huai Ying Huang, Ming Chih Lee, Wen Hsiung Chen, Wu-Ching Chou, Wei-Kuo Chen


研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)


Current conduction behavior on GaN V-defect was studied comprehensively using conductive atomic force microscopy. Experimental results indicate that the forward current in the V-defect region is at least three-order higher than that at surrounding area. On the other hand, a snowflake-like leakage current pattern was observed in the V-defect owing to the ease of current breakdown at the crest lines and perimeters. Further static current-voltage measurement suggests that the current flow is governed by Schottky emission and Fowler-Nordheim tunneling for V-defect region and surrounding area, respectively.

期刊Japanese Journal of Applied Physics, Part 2: Letters
出版狀態Published - 11 8月 2006


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