Crosstalk effect removal for analog measurement in analog test bus

Chau-Chin Su; Yue Tsang Chen

doi:10.1109/VTEST.2000.843871

Crosstalk effect removal for analog measurement in analog test bus

Chau-Chin Su^*, Yue Tsang Chen

^*此作品的通信作者

電機工程學系

研究成果 › 同行評審

3 引文斯高帕斯（Scopus）

摘要

A DSP based test methodology is proposed to remove the parasitic and crosstalk effects, the two major drawbacks when using the analog buses. Experiments, using SPICE simulation and real measurement data show a significant improvement over the direct measurement.

原文	English
頁面	403-408
頁數	6
DOIs	https://doi.org/10.1109/VTEST.2000.843871
出版狀態	Published - 1 1月 2000
事件	18th IEEE VLSI Test Symposium (VTS-2000) - Montreal, Que, Can 持續時間: 30 4月 2000 → 4 5月 2000

Conference

Conference	18th IEEE VLSI Test Symposium (VTS-2000)
城市	Montreal, Que, Can
期間	30/04/00 → 4/05/00

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10.1109/VTEST.2000.843871

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Link to publication in Scopus

引用此

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abstract = "A DSP based test methodology is proposed to remove the parasitic and crosstalk effects, the two major drawbacks when using the analog buses. Experiments, using SPICE simulation and real measurement data show a significant improvement over the direct measurement.",

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AU - Chen, Yue Tsang

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AB - A DSP based test methodology is proposed to remove the parasitic and crosstalk effects, the two major drawbacks when using the analog buses. Experiments, using SPICE simulation and real measurement data show a significant improvement over the direct measurement.

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M3 - Paper

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EP - 408

T2 - 18th IEEE VLSI Test Symposium (VTS-2000)

Y2 - 30 April 2000 through 4 May 2000

ER -

Crosstalk effect removal for analog measurement in analog test bus

摘要

Conference

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