Critical voltage reduction by alignment layer modification in Pi-cells

Wei Ching Wu*, Yi Fan Chen, Szu Fen Chen, Huang-Ming Chen

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

A new approach which can effectively lower the critical voltage (Vcr) of π cell has been realized in this study. New structure of π cell can increase the control range of driving voltage, which makes the gray scale manipulation near Vcr more stable without loosing the fast response property.

原文American English
主出版物標題IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings
頁面692-694
頁數3
出版狀態Published - 7月 2007
事件International Display Manufacturing Conference and Exhibition, IDMC 2007 - Taipei, 台灣
持續時間: 3 7月 20076 7月 2007

出版系列

名字IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings

Conference

ConferenceInternational Display Manufacturing Conference and Exhibition, IDMC 2007
國家/地區台灣
城市Taipei
期間3/07/076/07/07

指紋

深入研究「Critical voltage reduction by alignment layer modification in Pi-cells」主題。共同形成了獨特的指紋。

引用此