TY - GEN
T1 - Coverage loss by using space compactors in presence of unknown values
AU - Chao, Chia-Tso
AU - Wang, Seongmoon
AU - Chakradhar, Srimat T.
AU - Wei, Wenlong
AU - Cheng, Kwang Ting
PY - 2006
Y1 - 2006
N2 - The presence of unknown values in simulation is the greatest barrier to effective test response compaction. For space compactors, some responses may not be observable due to the masking effect caused by unknown values. This paper reports on experiments conducted to evaluate the impact on the test quality of various percentages of observable responses for both modeled and un-modeled faults.
AB - The presence of unknown values in simulation is the greatest barrier to effective test response compaction. For space compactors, some responses may not be observable due to the masking effect caused by unknown values. This paper reports on experiments conducted to evaluate the impact on the test quality of various percentages of observable responses for both modeled and un-modeled faults.
UR - http://www.scopus.com/inward/record.url?scp=34047156613&partnerID=8YFLogxK
U2 - 10.1109/DATE.2006.243930
DO - 10.1109/DATE.2006.243930
M3 - Conference contribution
AN - SCOPUS:34047156613
SN - 3981080114
SN - 9783981080117
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - Proceedings - Design, Automation and Test in Europe, DATE'06
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Design, Automation and Test in Europe, DATE'06
Y2 - 6 March 2006 through 10 March 2006
ER -