Coverage loss by using space compactors in presence of unknown values

Chia-Tso Chao*, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei, Kwang Ting Cheng

*此作品的通信作者

    研究成果: Conference contribution同行評審

    摘要

    The presence of unknown values in simulation is the greatest barrier to effective test response compaction. For space compactors, some responses may not be observable due to the masking effect caused by unknown values. This paper reports on experiments conducted to evaluate the impact on the test quality of various percentages of observable responses for both modeled and un-modeled faults.

    原文English
    主出版物標題Proceedings - Design, Automation and Test in Europe, DATE'06
    發行者Institute of Electrical and Electronics Engineers Inc.
    ISBN(列印)3981080114, 9783981080117
    DOIs
    出版狀態Published - 2006
    事件Design, Automation and Test in Europe, DATE'06 - Munich, Germany
    持續時間: 6 3月 200610 3月 2006

    出版系列

    名字Proceedings -Design, Automation and Test in Europe, DATE
    1
    ISSN(列印)1530-1591

    Conference

    ConferenceDesign, Automation and Test in Europe, DATE'06
    國家/地區Germany
    城市Munich
    期間6/03/0610/03/06

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