Corrigendum to “Low-damage NH3 plasma treatment on SiO2 tunneling oxide of chemically-synthesized gold nanoparticle nonvolatile memory” [Curr. Appl. Phys. (2016) 16(5) (605−610)] (S1567173916300487)(10.1016/j.cap.2016.03.009)

Jer Chyi Wang*, Kai Ping Chang, Chin Hsiang Liao, Ruey Dar Chang, Chao Sung Lai, Li Chun Chang

*此作品的通信作者

研究成果: Comment/debate

摘要

The authors regret for the erroneous affiliations of Chao-Sung Lai: Chao-Sung Lai a, c a Department of Electronic Engineering, Chang Gung University, Guishan Dist., 33302, Taoyuan, Taiwan c Center for Reliability Sciences & Technologies (CREST), Chang Gung University, Guishan Dist., 33302, Taoyuan, Taiwan It should be as follows: Chao-Sung Lai a, c, e a Department of Electronic Engineering, Chang Gung University, Guishan Dist., 33302, Taoyuan, Taiwan c Center for Reliability Sciences & Technologies (CREST), Chang Gung University, Guishan Dist., 33302, Taoyuan, Taiwan e Department of Nephrology, Chang Gung Memorial Hospital, Guishan Dist. 33305, Taoyuan, Taiwan The authors would like to apologise for any inconvenience caused.

原文English
頁(從 - 到)592
頁數1
期刊Current Applied Physics
17
發行號4
DOIs
出版狀態Published - 1 4月 2017

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