Correlation between transmission-line-pulsing I-V curve and human-body-model ESD level on low temperature poly-Si TFT devices

Ming-Dou Ker*, Chun Lin Hou, Chih Yih Chang, Fang Tsun Chu

*此作品的通信作者

    研究成果: Paper同行評審

    12 引文 斯高帕斯(Scopus)

    指紋

    深入研究「Correlation between transmission-line-pulsing I-V curve and human-body-model ESD level on low temperature poly-Si TFT devices」主題。共同形成了獨特的指紋。

    Engineering & Materials Science