Controlled single-electron effects in multiple-gate SOI MOSFETs near room temperature

Wei Lee; Pin Su; Hou Yu Chen; Yun Chang; Ke Wei Su; Sally Liu; Fu Liang Yang

doi:10.1109/SOI.2006.284434

Controlled single-electron effects in multiple-gate SOI MOSFETs near room temperature

Wei Lee^*, Pin Su, Hou Yu Chen, Yun Chang, Ke Wei Su, Sally Liu, Fu Liang Yang

^*此作品的通信作者

研究成果: Conference contribution › 同行評審

原文	English
主出版物標題	2006 IEEE international SOI Conference Proceedings
發行者	Institute of Electrical and Electronics Engineers Inc.
頁面	63-64
頁數	2
ISBN（列印）	1424402905, 9781424402908
DOIs	https://doi.org/10.1109/SOI.2006.284434
出版狀態	Published - 2006
事件	2006 IEEE International Silicon on Insulator Conference, SOI - Niagara Falls, NY, 美國持續時間: 2 10月 2006 → 5 10月 2006

出版系列

名字	Proceedings - IEEE International SOI Conference
ISSN（列印）	1078-621X

Conference

Conference	2006 IEEE International Silicon on Insulator Conference, SOI
國家/地區	美國
城市	Niagara Falls, NY
期間	2/10/06 → 5/10/06

存取文件

10.1109/SOI.2006.284434

其它文件與鏈接

Link to publication in Scopus

引用此

Lee, W., Su, P., Chen, H. Y., Chang, Y., Su, K. W., Liu, S., & Yang, F. L. (2006). Controlled single-electron effects in multiple-gate SOI MOSFETs near room temperature. 於 2006 IEEE international SOI Conference Proceedings (頁 63-64). 文章 4062882 (Proceedings - IEEE International SOI Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SOI.2006.284434

@inproceedings{cb6fdc3f8e8a4a78b4ae8bbf3af04dbf,

title = "Controlled single-electron effects in multiple-gate SOI MOSFETs near room temperature",

author = "Wei Lee and Pin Su and Chen, {Hou Yu} and Yun Chang and Su, {Ke Wei} and Sally Liu and Yang, {Fu Liang}",

year = "2006",

doi = "10.1109/SOI.2006.284434",

language = "English",

isbn = "1424402905",

series = "Proceedings - IEEE International SOI Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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note = "2006 IEEE International Silicon on Insulator Conference, SOI ; Conference date: 02-10-2006 Through 05-10-2006",

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Lee, W, Su, P, Chen, HY, Chang, Y, Su, KW, Liu, S & Yang, FL 2006, Controlled single-electron effects in multiple-gate SOI MOSFETs near room temperature. 於 2006 IEEE international SOI Conference Proceedings., 4062882, Proceedings - IEEE International SOI Conference, Institute of Electrical and Electronics Engineers Inc., 頁 63-64, 2006 IEEE International Silicon on Insulator Conference, SOI, Niagara Falls, NY, 美國, 2/10/06. https://doi.org/10.1109/SOI.2006.284434

TY - GEN

T1 - Controlled single-electron effects in multiple-gate SOI MOSFETs near room temperature

AU - Lee, Wei

AU - Su, Pin

AU - Chen, Hou Yu

AU - Chang, Yun

AU - Su, Ke Wei

AU - Liu, Sally

AU - Yang, Fu Liang

PY - 2006

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DO - 10.1109/SOI.2006.284434

M3 - Conference contribution

AN - SCOPUS:43749085531

SN - 1424402905

SN - 9781424402908

T3 - Proceedings - IEEE International SOI Conference

SP - 63

EP - 64

BT - 2006 IEEE international SOI Conference Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2006 IEEE International Silicon on Insulator Conference, SOI

Y2 - 2 October 2006 through 5 October 2006

ER -