Continual Learning with Out-of-Distribution Data Detection for Defect Classification

Cheng Hsueh Lin, Chia Yu Lin*, Li Jen Wang, Ted T. Kuo

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

We propose a framework for defect detection in production lines that leverages deep learning models, out-of-distribution (OOD) detection, and continual learning to address the challenges of unknown defects and catastrophic forgetting. The proposed method divides classifier training into chronicle tasks, each introducing new defect classes and leveraging OOD detection to classify unknown defects. We evaluate the framework on a highly unbalanced product defect dataset and demonstrated that it outperformed existing approaches, improving the average F-score by 10%. Our method also improve the performance of the PODNet and DER models, but not the WA model due to its poor performance on our dataset. These results suggest that the proposed method has the potential to improve defect detection in production lines, especially for small-quantity-wide-variety production scenarios.

原文English
主出版物標題2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
頁面337-338
頁數2
ISBN(電子)9798350324174
DOIs
出版狀態Published - 2023
事件2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Pingtung, 台灣
持續時間: 17 7月 202319 7月 2023

出版系列

名字2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Proceedings

Conference

Conference2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023
國家/地區台灣
城市Pingtung
期間17/07/2319/07/23

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