Conductive bridge random access memory characteristics of SiCN based transparent device due to indium diffusion

Dayanand Kumar, Rakesh Aluguri, Umesh Chand, Tseung-Yuen Tseng

研究成果: Article同行評審

26 引文 斯高帕斯(Scopus)

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深入研究「Conductive bridge random access memory characteristics of SiCN based transparent device due to indium diffusion」主題。共同形成了獨特的指紋。

Keyphrases

Material Science