Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs

S. Abhinay*, W. M. Wu, C. A. Shih, S. H. Chen, A. Sibaja-Hernandez, B. Parvais, U. Peralagu, A. Alian, Tian-Li Wu, M. D. Ker, G. Groeseneken, N. Collaert

*此作品的通信作者

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science