Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
Ting Yu Chang, Kuan Chi Wang, Hsien Yang Liu, Jing Hua Hseun, Wei Cheng Peng, Nicolò Ronchi, Umberto Celano, Kaustuv Banerjee, Jan Van Houdt, Tian Li Wu*
*此作品的通信作者
研究成果: Article › 同行評審