Comprehensive examination of threshold voltage fluctuations in nanoscale planar MOSFET and bulk FinFET devices

Chih Hong Hwang*, Hui Wen Cheng, Ta Ching Yeh, Tien Yeh Li, Hsuan Ming Huang, Yi-Ming Li

*此作品的通信作者

研究成果: Conference contribution同行評審

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Keyphrases

Engineering

Material Science