Complementary substrate-triggered SCR devices for on-chip ESD protection circuits

Ming-Dou Ker, Kuo Chun Hsu

    研究成果: Conference contribution同行評審

    5 引文 斯高帕斯(Scopus)

    摘要

    The turn-on mechanism of SCR device is essentially a current triggering event. While a current is applied to the base or substrate of a SCR device, it can be quickly triggered on into its latching state. In this paper, the complementary substrate-triggered SCR devices, which are combined with the substrate-triggered technique and SCR devices, are first reported in the literature for using in the on-chip ESD protection circuits. A complementary style on the substrate-triggered SCR devices is designed to discharge both of the positive and negative ESD stresses on the pad. The total holding voltage of the substrate-triggered SCR device can be increased by adding the stacked diode string to avoid the transient-induced latchup issue in the ESD protection circuits. The on-chip ESD protection circuits designed with the proposed complementary substrate-triggered SCR devices for the I/O pad and power pad have been successfully verified in a 0.25-μm STI CMOS process with the HBM (MM) ESD level of >8kV (650V) in a small layout area.

    原文English
    主出版物標題Proceedings - 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002
    編輯John Chickanosky, Ram K. Krishnamurthy, P.R. Mukund
    發行者Institute of Electrical and Electronics Engineers Inc.
    頁面229-233
    頁數5
    ISBN(電子)0780374940
    DOIs
    出版狀態Published - 1 1月 2002
    事件15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002 - Rochester, United States
    持續時間: 25 9月 200228 9月 2002

    出版系列

    名字Proceedings of the Annual IEEE International ASIC Conference and Exhibit
    2002-January
    ISSN(列印)1063-0988

    Conference

    Conference15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002
    國家/地區United States
    城市Rochester
    期間25/09/0228/09/02

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