Comparison of Intrinsic Gettering and Epitaxial Wafers in Terms of Soft Error Endurance and Other Characteristics of 64k Bit Dynamic RAM

Hiroshi Iwai, Hideo Otsuka, Yasuo Matsumotc, Kiyoshi Hisatomi, Kyoji Aoki

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

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Chemical Compounds

Engineering & Materials Science