Comparison of Deep Learning Algorithms on Defect Detection on Metal Laptop Cases

Hsien I. Lin, Rupa Rohidas Landge

研究成果: Conference contribution同行評審

摘要

Defect detection is crucial in industrial quality control. There are innumerable methods available for manual inspection, but these methods are time and resource consuming. We proposed an automatic defect detection method on metal laptop cases using deep learning algorithms. In this study, we used a 6-DOF robotic arm to collect the defect dataset and these defects are learned by three different methods. In this paper, we compared renowned detection methods YOLOv3, Faster R-CNN, and SSD over traditional defect detection methods. These methods outperformed incompetent conventional methods. The accuracy of Faster R-CNN had the best result compared to SSD and YOLOv3 on the defect dataset. Faster R-CNN had a recall rate of 80% and precision of 80%, whereas YOLOv3 had a recall rate of 73% and a mean average precision of 83%.

原文English
主出版物標題2021 International Automatic Control Conference, CACS 2021
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781665444125
DOIs
出版狀態Published - 2021
事件2021 International Automatic Control Conference, CACS 2021 - Chiayi, 台灣
持續時間: 3 11月 20216 11月 2021

出版系列

名字2021 International Automatic Control Conference, CACS 2021

Conference

Conference2021 International Automatic Control Conference, CACS 2021
國家/地區台灣
城市Chiayi
期間3/11/216/11/21

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