Compact models of negative-capacitance FinFETs: Lumped and distributed charge models

Juan P. Duarte, Sourabh Khandelwal, Asif I. Khan, Angada Sachid, Yen Kai Lin, Huan Lin Chang, Sayeef Salahuddin, Chen-Ming Hu

研究成果: Conference contribution同行評審

66 引文 斯高帕斯(Scopus)

指紋

深入研究「Compact models of negative-capacitance FinFETs: Lumped and distributed charge models」主題。共同形成了獨特的指紋。

Keyphrases

Material Science

Engineering