Compact Modeling and Experimental Validation of Reverse Mode Impact Ionization in LDMOS Transistors within the BSIM-BULK Framework

Yawar Hayat Zarkob*, Ayushi Sharma, Girish Pahwa, Debashish Nandi, Chetan K. Dabhi, Volker Kubrak, Bob Peddenpohl, Mingchun Tang, Chenming Hu, Yogesh Singh Chauhan

*此作品的通信作者

研究成果: Conference contribution › 同行評審

1 引文 斯高帕斯（Scopus）

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Keyphrases

Material Science

Engineering

Physics

Earth and Planetary Sciences

Biochemistry, Genetics and Molecular Biology