摘要
In this work, a dynamic weighting-artificial neural network (DW-ANN) methodology is presented for quick and automated compact model (CM) generation. It takes advantage of both TCAD simulations for high accuracy and SPICE simulations for cost-effectiveness. This methodology is developed for gate-all-around (GAA) silicon (Si) nanosheet (NS) complementary field effect transistor (CFET), a potential candidate for future CMOS technology due to its innate properties. The critical process variation (PV) sources that severely degrade the CFET performance are estimated using DW-ANN. It reduces the computation cost and predicts the effects of PV sources with less than 1% error. Furthermore, a compact DW-ANN-based Verilog-A model has been developed that captures the dc as well as transient behavior accurately for circuit-level analysis. CFET-based circuits such as inverter, 6T-static random access memory (SRAM), and ring oscillator (RO) are characterized and implemented using DW-ANN-based CM. The overall average error of the model is reported as less than 2%. Therefore, the proposed device and circuit modeling approach provides a feasible solution for the rapid compact modeling of new emerging devices with good convergence and high accuracy.
原文 | English |
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頁(從 - 到) | 1-8 |
頁數 | 8 |
期刊 | IEEE Transactions on Electron Devices |
DOIs | |
出版狀態 | Accepted/In press - 2023 |