TY - GEN
T1 - Common-Centroid Layout for Active and Passive Devices
T2 - 27th Asia and South Pacific Design Automation Conference, ASP-DAC 2022
AU - Karmokar, Nibedita
AU - Madhusudan, Meghna
AU - Sharma, Arvind K.
AU - Harjani, Ramesh
AU - Lin, Mark Po Hung
AU - Sapatnekar, Sachin S.
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - This paper presents an overview of common-centroid (CC) layout styles, used in analog designs to overcome the impact of systematic variations. CC layouts must be carefully engineered to minimize the impact of mismatch. Algorithms for CC layout must be aware of routing parasitics, layout-dependent effects (for active devices), and the performance impact of layout choices. The optimal CC layout further depends on factors such as the choice of the unit device and the relative impact of uncorrelated and systematic variations. The paper also examines scenarios where non-CC layouts may be preferable to CC layouts.
AB - This paper presents an overview of common-centroid (CC) layout styles, used in analog designs to overcome the impact of systematic variations. CC layouts must be carefully engineered to minimize the impact of mismatch. Algorithms for CC layout must be aware of routing parasitics, layout-dependent effects (for active devices), and the performance impact of layout choices. The optimal CC layout further depends on factors such as the choice of the unit device and the relative impact of uncorrelated and systematic variations. The paper also examines scenarios where non-CC layouts may be preferable to CC layouts.
UR - http://www.scopus.com/inward/record.url?scp=85126112964&partnerID=8YFLogxK
U2 - 10.1109/ASP-DAC52403.2022.9712576
DO - 10.1109/ASP-DAC52403.2022.9712576
M3 - Conference contribution
AN - SCOPUS:85126112964
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 114
EP - 121
BT - ASP-DAC 2022 - 27th Asia and South Pacific Design Automation Conference, Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 17 January 2022 through 20 January 2022
ER -