@inproceedings{cd442b63a80d414a890a56f0b922f0a3,
title = "Common-Centroid Layout for Active and Passive Devices: A Review and the Road Ahead",
abstract = "This paper presents an overview of common-centroid (CC) layout styles, used in analog designs to overcome the impact of systematic variations. CC layouts must be carefully engineered to minimize the impact of mismatch. Algorithms for CC layout must be aware of routing parasitics, layout-dependent effects (for active devices), and the performance impact of layout choices. The optimal CC layout further depends on factors such as the choice of the unit device and the relative impact of uncorrelated and systematic variations. The paper also examines scenarios where non-CC layouts may be preferable to CC layouts. ",
author = "Nibedita Karmokar and Meghna Madhusudan and Sharma, {Arvind K.} and Ramesh Harjani and Lin, {Mark Po Hung} and Sapatnekar, {Sachin S.}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; null ; Conference date: 17-01-2022 Through 20-01-2022",
year = "2022",
doi = "10.1109/ASP-DAC52403.2022.9712576",
language = "English",
series = "Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "114--121",
booktitle = "ASP-DAC 2022 - 27th Asia and South Pacific Design Automation Conference, Proceedings",
address = "United States",
}