Comment on 'Electron-phonon scattering in Sn-doped In2O 3 FET nanowires probed by temperature-dependent measurements'

Juhn-Jong Lin*, Chih Yuan Wu

*此作品的通信作者

研究成果: Comment/debate

摘要

We point out that the recently reported electrical quantities and transport behavior in a Sn-doped indium oxide FET nanowire (Berengue et al 2009 Nanotechnology 20 245706) should require serious reevaluation.

原文English
文章編號468001
頁數1
期刊Nanotechnology
20
發行號46
DOIs
出版狀態Published - 9 11月 2009

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