Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

M. F. Chang; L. Y. Chiou; Kuei-Ann Wen

doi:10.1049/el:20051738

Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

M. F. Chang^*, L. Y. Chiou, Kuei-Ann Wen

^*此作品的通信作者

研究成果: Article › 同行評審

1 引文斯高帕斯（Scopus）

摘要

A dynamic bitline shielding (DBS) technique is proposed for high-speed via-programming ROMs, to eliminate code-pattern-dependent crosstalk-induced read failure (CIRF) and increase code-pattern coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.

原文	English
頁（從 - 到）	834-835
頁數	2
期刊	Electronics Letters
卷	41
發行號	15
DOIs	https://doi.org/10.1049/el:20051738
出版狀態	Published - 21 7月 2005

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10.1049/el:20051738

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@article{503ebfafdf87448f86295abe8a236bbb,

title = "Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique",

abstract = "A dynamic bitline shielding (DBS) technique is proposed for high-speed via-programming ROMs, to eliminate code-pattern-dependent crosstalk-induced read failure (CIRF) and increase code-pattern coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.",

author = "Chang, {M. F.} and Chiou, {L. Y.} and Kuei-Ann Wen",

year = "2005",

month = jul,

day = "21",

doi = "10.1049/el:20051738",

language = "English",

volume = "41",

pages = "834--835",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "Institution of Engineering and Technology",

number = "15",

}

TY - JOUR

T1 - Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

AU - Chang, M. F.

AU - Chiou, L. Y.

AU - Wen, Kuei-Ann

PY - 2005/7/21

Y1 - 2005/7/21

N2 - A dynamic bitline shielding (DBS) technique is proposed for high-speed via-programming ROMs, to eliminate code-pattern-dependent crosstalk-induced read failure (CIRF) and increase code-pattern coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.

AB - A dynamic bitline shielding (DBS) technique is proposed for high-speed via-programming ROMs, to eliminate code-pattern-dependent crosstalk-induced read failure (CIRF) and increase code-pattern coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.

UR - http://www.scopus.com/inward/record.url?scp=23344449656&partnerID=8YFLogxK

U2 - 10.1049/el:20051738

DO - 10.1049/el:20051738

M3 - Article

AN - SCOPUS:23344449656

SN - 0013-5194

VL - 41

SP - 834

EP - 835

JO - Electronics Letters

JF - Electronics Letters

IS - 15

ER -

Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

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