摘要
We have demonstrated a wide radiation temperature measurement by using a single-photon avalanche diode (SPAD) image array that is analogous to a silicon photomultiplier with a time-gating technique and an adjustable summed output. The detection temperature window ranging from 280 °C to 1050 °C can be achieved with a noise equivalent temperature difference (NETD) value of below 1 °C. The thermal image with a high detection rate up to 1680 Hz is obtained at the same detection temperature as a commercial CMOS thermal camera. We further demonstrate a thermal image with a spatial resolution of 80μm.
原文 | English |
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頁(從 - 到) | 20230-20237 |
頁數 | 8 |
期刊 | IEEE Sensors Journal |
卷 | 22 |
發行號 | 21 |
DOIs | |
出版狀態 | Published - 1 11月 2022 |